Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/3528
Title: | Investigation of electrical properties of zro2 and hfo2 high k dielectric thin films in mos capacitors |
metadata.dc.contributor.*: | Udaya Bhanu, J Thangadurai, P |
Keywords: | complementary metal oxide semiconductor microelectronic memory MOS capacitors |
Issue Date: | 2019 |
Publisher: | Centre for Nano Sciences & Technology, Pondicherry University |
Description: | 159p. |
URI: | http://localhost:8080/xmlui/handle/123456789/3528 |
Appears in Collections: | Theses |
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